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[IEEE 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - St. Petersburg and Moscow, Russia (2020.1.27-2020.1.30)] 2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - The Problems of Measuring the Electrical Conductivity and the Implementation of Its Measurement Methods of High-alloyed Semiconductors
Shtern, Maxim, Karavaev, Ivan, Rogachev, Maxim, Mustafoev, BekhzodYear:
2020
DOI:
10.1109/eiconrus49466.2020.9039415
File:
PDF, 848 KB
2020