[IEEE 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Grenoble, France (2019.4.1-2019.4.3)] 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Robust Methodology for Low-Frequency Noise Power Analyses in Advanced MOS Transistors
Van Brandt, Leopold, Esfeh, Bahak Kazemi, Kilchytska, Valeriya, Flandre, DenisYear:
2019
DOI:
10.1109/eurosoi-ulis45800.2019.9041859
File:
PDF, 292 KB
2019