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[IEEE 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Grenoble, France (2019.4.1-2019.4.3)] 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Behavior of Gold-Doped Silicon Substrate under Small- and Large-RF Signal
Nabet, Massinissa, Rack, Martin, de Groot, C. H. Kees, Raskin, Jean-PierreYear:
2019
DOI:
10.1109/eurosoi-ulis45800.2019.9041892
File:
PDF, 3.06 MB
2019