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[IEEE 2019 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-TW) - YILAN, Taiwan (2019.5.20-2019.5.22)] 2019 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-TW) - Channel- & Drift Region's STI-Lengths Impacts of ESD Immunity in HV 60 V nLDMOS Devices

Fan, Sheng-Kai, Chen, Shen-Li, Jhou, Yu-Lin, Wu, Pei-Lin, Lin, Po-Lin
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Year:
2019
DOI:
10.1109/icce-tw46550.2019.8991809
File:
PDF, 5.73 MB
2019
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