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[IEEE 2020 IEEE International Conference on Consumer Electronics (ICCE) - Las Vegas, NV, USA (2020.1.4-2020.1.6)] 2020 IEEE International Conference on Consumer Electronics (ICCE) - Flash based SSD Aware Parity Logging for Building Reliable Massive Capacity SSDs
Kim, Jaeho, Lee, Eunjae, Park, Jung KyuYear:
2020
DOI:
10.1109/icce46568.2020.9043127
File:
PDF, 408 KB
2020