[IEEE 2019 International Conference on Information...

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[IEEE 2019 International Conference on Information Technology (ICIT) - Bhubaneswar, India (2019.12.19-2019.12.21)] 2019 International Conference on Information Technology (ICIT) - Fault Coverage Enhancement via Weighted Random Pattern Generation in BIST Using a DNN-Driven-PSO Approach

Maity, Hillol, Khatua, Kaushik, Chattopadhyay, Santanu, Sengupta, Indranil, Patankar, Girish, Bhattacharya, Parthajit
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Year:
2019
DOI:
10.1109/icit48102.2019.00047
File:
PDF, 182 KB
2019
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