[IEEE 2018 Eighth International Conference on...

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[IEEE 2018 Eighth International Conference on Instrumentation & Measurement, Computer, Communication and Control (IMCCC) - Harbin, China (2018.7.19-2018.7.21)] 2018 Eighth International Conference on Instrumentation & Measurement, Computer, Communication and Control (IMCCC) - A Template Matching Based Method for Surface-Mount Rectangular-Pin-Chip Positioning and Defect Detection

Han, Boxuan, Yi, Ming
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Year:
2018
DOI:
10.1109/imccc.2018.00212
File:
PDF, 495 KB
2018
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