A Novel General Compact Model Approach for 7-nm Technology...

A Novel General Compact Model Approach for 7-nm Technology Node Circuit Optimization From Device Perspective and Beyond

Huo, Qiang, Wu, Zhenhua, Huang, Weixing, Wang, Xingsheng, Tang, Geyu, Yao, Jiaxin, Liu, Yongpan, Zhao, Xiaojin, Zhang, Feng, Li, Ling, Liu, Ming
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Volume:
8
Year:
2020
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/jeds.2020.2980441
File:
PDF, 2.14 MB
2020
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