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[IEEE 2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE) - Zhangjiajie, China (2019.8.6-2019.8.9)] 2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE) - Degradation Study of 830nm Laser Diodes Based on PSpice Model and Accelerated Tests
Yang, Peng, Wang, Gui-Shan, Wu, Wei-Xing, Qiu, JingYear:
2019
DOI:
10.1109/qr2mse46217.2019.9021267
File:
PDF, 1.09 MB
2019