IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2007 / 5 Vol. 26; Iss. 5
Scan test cost and power reduction through systematic scan reconfiguration
Al-Yamani, Ahmad, Devta-Prasanna, Narendra, Chmelar, Erik, Grinchuk, Mikhail, Gunda, ArunVolume:
26
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2007.8361584
Date:
May, 2007
File:
PDF, 832 KB
2007