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IEEE Transactions on Electron Devices 2020

Optimized Design of Carrier Injection Terminal for Reliable Low-Temperature Poly-Si TFTs Under Dynamic Hot-Carrier Stress

Chen, Lekai, Wu, Yanwen, Zhang, Dongli, Wang, Huaisheng, Wang, Mingxiang
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Year:
2020
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2020.2977854
File:
PDF, 2.07 MB
2020
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