Low-Frequency Noise Parameter Extraction Method for...

IEEE Transactions on Electron Devices 2020 / 5 Vol. 67; Iss. 5

Low-Frequency Noise Parameter Extraction Method for Single-Layer Graphene FETs

Mavredakis, Nikolaos, Wei, Wei, Pallecchi, Emiliano, Vignaud, Dominique, Happy, Henri, Cortadella, Ramon Garcia, Schaefer, Nathan, Calia, Andrea Bonaccini, Garrido, Jose Antonio, Jimenez, David
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Volume:
67
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2020.2978215
Date:
May, 2020
File:
PDF, 1.17 MB
2020
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