Automatic Extraction of Measurement-Based Large-Signal FET...

IEEE Transactions on Microwave Theory and Techniques 2020 / 5 Vol. 68; Iss. 5

Automatic Extraction of Measurement-Based Large-Signal FET Models by Nonlinear Function Sampling

Martin-Guerrero, Teresa M., Santarelli, Alberto, Gibiino, Gian Piero, Traverso, Pier Andrea, Camacho-Penalosa, Carlos, Filicori, Fabio
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Volume:
68
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/tmtt.2020.2968886
Date:
May, 2020
File:
PDF, 3.57 MB
2020
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