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Modeling Avalanche Induced Degradation for 4H-SiC Power MOSFETs
Wei, Jiaxing, Liu, Siyang, Xiaobing, Zhang, Sun, Weifeng, Huang, Alex Q.Year:
2020
Journal:
IEEE Transactions on Power Electronics
DOI:
10.1109/tpel.2020.2984650
File:
PDF, 2.38 MB
2020