[IEEE 2019 International Conference on Electrical, Electronics and Computer Engineering (UPCON) - ALIGARH, India (2019.11.8-2019.11.10)] 2019 International Conference on Electrical, Electronics and Computer Engineering (UPCON) - Absolute âTwo measurementâ vs Relative quantum yield measurement techniques:An experimental analysis
Bhatt, Aditya Nath, Verma, Upendra Kumar, Kumar, BrijeshYear:
2019
DOI:
10.1109/upcon47278.2019.8980195
File:
PDF, 1.09 MB
2019