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Copy-Move Forgery Detection Using Scale Invariant Feature and Reduced Local Binary Pattern Histogram
Park, Jun Young, Kang, Tae An, Moon, Yong Ho, Eom, Il KyuVolume:
12
Journal:
Symmetry
DOI:
10.3390/sym12040492
Date:
March, 2020
File:
PDF, 5.25 MB
2020