Topological Hall Effect in Single Thick SrRuO...

Advanced Electronic Materials 2020 / 04

Topological Hall Effect in Single Thick SrRuO 3 Layers Induced by Defect Engineering

Wang, Changan, Chang, Ching-Hao, Herklotz, Andreas, Chen, Chao, Ganss, Fabian, Kentsch, Ulrich, Chen, Deyang, Gao, Xingsen, Zeng, Yu-Jia, Hellwig, Olav, Helm, Manfred, Gemming, Sibylle, Chu, Ying-Hao,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Journal:
Advanced Electronic Materials
DOI:
10.1002/aelm.202000184
Date:
April, 2020
File:
PDF, 1.18 MB
2020
Conversion to is in progress
Conversion to is failed