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Tip-sample characterization in the AFM study of a rod-shaped nanostructure
Picotto, Gian Bartolo, Vallino, Marta, Ribotta, LuigiJournal:
Measurement Science and Technology
DOI:
10.1088/1361-6501/ab7bc2
Date:
March, 2020
File:
PDF, 1.15 MB
2020