Physically Consistent Method for Calculating...

IEEE Transactions on Electron Devices 2020 / 5 Vol. 67; Iss. 5

Physically Consistent Method for Calculating Trap-Assisted-Tunneling Current Applied to Line Tunneling Field-Effect Transistor

Najam, Faraz, Kim, Sangwan, Choi, Woo Young, Yu, Yun Seop
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Volume:
67
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.2982262
Date:
May, 2020
File:
PDF, 1.94 MB
2020
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