Direct Observation of the Surface Topography at High...

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Microscopy and Microanalysis 2020 / 04

Direct Observation of the Surface Topography at High Temperature with SEM

Podor, Renaud, Le Goff, Xavier, Lautru, Joseph, Brau, Henri-Pierre, Barreau, Mathias, Carrier, Xavier, Mendonça, Jerôme, Nogues, Dorian, Candeias, Antoine
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Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927620001348
Date:
April, 2020
File:
PDF, 791 KB
2020
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