Self-Pixelation Through Fracture in VO 2...

ACS Applied Electronic Materials 2020 / 04

Self-Pixelation Through Fracture in VO 2 Thin Films

Rodríguez, Laura, del Corro, Elena, Conroy, Michele, Moore, Kalani, Sandiumenge, Felip, Domingo, Neus, Santiso, José, Catalan, Gustau
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Journal:
ACS Applied Electronic Materials
DOI:
10.1021/acsaelm.0c00199
Date:
April, 2020
File:
PDF, 1.70 MB
2020
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