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Analysis of Dislocations in CdZnTe Epitaxial Film with Kelvin Probe and Conductive Atomic Force Microscopy
Cao, Kun, Jie, Wanqi, Zha, Gangqiang, Dong, Jiangpeng, Hu, Ruiqi, Li, YangVolume:
49
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-020-08094-x
Date:
June, 2020
File:
PDF, 921 KB
2020