Band alignment of two-dimensional h-BN/MoS2 van der Waals heterojunction measured by X-ray photoelectron spectroscopy
Xing, Shuâan, Zhao, Guijuan, Wang, Jie, Xu, Yan, Ma, Zhixin, Li, Xunshuan, Yang, Wenge, Liu, Guipeng, Yang, JianhongVolume:
834
Journal:
Journal of Alloys and Compounds
DOI:
10.1016/j.jallcom.2020.155108
Date:
September, 2020
File:
PDF, 1.86 MB
2020