Statistical sensitivity of the nEDM apparatus at PSI to n â n â² oscillations
Abel, C., Ayres, N.J., Bison, G., Bodek, K., Bondar, V., Chiu, P.-J., Daum, M., Emmenegger, S., Flaux, P., Ferraris-Bouchez, L., Griffith, W.C., GrujiÄ, Z.D., Hild, N., Kirch, K., Koss, P.A., Kozela,Volume:
219
Year:
2019
Journal:
EPJ Web of Conferences
DOI:
10.1051/epjconf/201921907001
File:
PDF, 1.04 MB
2019