Analysis of ways and methods of deformation measuring of...

IOP Conference Series Materials Science and Engineering 2020 / 01 Vol. 709

Analysis of ways and methods of deformation measuring of rigid mounted axially symmetrical device elements.

Krivov, A V, Trutnev, G A, Shenyatski, A V, Melnikov, R V
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Volume:
709
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/709/2/022047
Date:
January, 2020
File:
PDF, 471 KB
2020
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