Realistic dimension-independent approach for charged-defect...

Physical Review B 2020 / 4 Vol. 101; Iss. 16

Realistic dimension-independent approach for charged-defect calculations in semiconductors

Xiao, Jin, Yang, Kaike, Guo, Dan, Shen, Tao, Deng, Hui-Xiong, Li, Shu-Shen, Luo, Jun-Wei, Wei, Su-Huai
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Volume:
101
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.101.165306
Date:
April, 2020
File:
PDF, 839 KB
2020
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