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[IEEE 2020 16th IEEE International Colloquium on Signal Processing & Its Applications (CSPA) - Langkawi, Malaysia (2020.2.28-2020.2.29)] 2020 16th IEEE International Colloquium on Signal Processing & Its Applications (CSPA) - Convolutional Neural Network for Imbalanced Data Classification of Silicon Wafer Defects
Batool, Uzma, Shapiai, Mohd Ibrahim, Fauzi, Hilman, Fong, Jia XianYear:
2020
DOI:
10.1109/CSPA48992.2020.9068669
File:
PDF, 1.08 MB
2020