[IEEE NAECON 2019 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2019.7.15-2019.7.19)] 2019 IEEE National Aerospace and Electronics Conference (NAECON) - Deep Learning Ensemble Methods for Skin Lesion Analysis towards Melanoma Detection
Ali, Redha, Hardie, Russell C., Narayanan Narayanan, Barath, De Silva, SupunYear:
2019
DOI:
10.1109/NAECON46414.2019.9058245
File:
PDF, 1.46 MB
2019