A Statistical Gate Sizing Method for Timing Yield and Lifetime Reliability Optimization of Integrated Circuits
Ibrahimi, S. Milad, Ghavami, Behnam, Raji, MohsenYear:
2020
Journal:
IEEE Transactions on Emerging Topics in Computing
DOI:
10.1109/TETC.2020.2987946
File:
PDF, 351 KB
2020