[IEEE 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Richland, WA, USA (2019.10.20-2019.10.23)] 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Investigation on the Breakdown Strength of Aged Special Layered Silicone Dielectrics under DC Stres
Aganbegovic, Mirnes, Werle, PeterYear:
2019
DOI:
10.1109/ceidp47102.2019.9009661
File:
PDF, 1.43 MB
2019