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Defect Analysis and Parallel Testing for 3D Hybrid CMOS-Memristor Memory
Liu, Peng, You, Zhiqiang, Wu, Jigang, Elimu, Michael, Wang, Weizheng, Cai, Shuo, Han, YinheYear:
2020
Journal:
IEEE Transactions on Emerging Topics in Computing
DOI:
10.1109/tetc.2020.2982830
File:
PDF, 10.73 MB
2020