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Discussion on âAssessing the goodness of fit of logistic regression models in large samples: A modification of the Hosmer-Lemeshow testâ by Giovanni Nattino, Michael L. Pennell, and Stanley Lemeshow
Liu, Ivy, Fernández, DanielJournal:
Biometrics
DOI:
10.1111/biom.13251
Date:
April, 2020
File:
PDF, 420 KB
2020