Conductive Atomic Force Microscopy of Semiconducting...

Nanomaterials 2020 / 04 Vol. 10; Iss. 4

Conductive Atomic Force Microscopy of Semiconducting Transition Metal Dichalcogenides and Heterostructures

Giannazzo, Filippo, Schilirò, Emanuela, Greco, Giuseppe, Roccaforte, Fabrizio
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Volume:
10
Journal:
Nanomaterials
DOI:
10.3390/nano10040803
Date:
April, 2020
File:
PDF, 2.77 MB
2020
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