Characterization of materials embedded in thick objects...

Characterization of materials embedded in thick objects using spectral small-angle x-ray scattering

Dahal, Eshan, Ghammraoui, Bahaa, Badano, Aldo
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Volume:
53
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/1361-6463/ab8248
Date:
June, 2020
File:
PDF, 4.62 MB
2020
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