Characterization of materials embedded in thick objects using spectral small-angle x-ray scattering
Dahal, Eshan, Ghammraoui, Bahaa, Badano, AldoVolume:
53
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/1361-6463/ab8248
Date:
June, 2020
File:
PDF, 4.62 MB
2020