A CMOS Image Sensor Pixel Combining Deep Sub-electron Noise...

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IEEE Electron Device Letters 2020

A CMOS Image Sensor Pixel Combining Deep Sub-electron Noise with Wide Dynamic Range

Boukhayma, Assim, Caizzone, Antonino, Enz, Christian
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Year:
2020
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2020.2988378
File:
PDF, 335 KB
2020
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