[IEEE 2019 Device Research Conference (DRC) - Ann Arbor,...

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[IEEE 2019 Device Research Conference (DRC) - Ann Arbor, MI, USA (2019.6.23-2019.6.26)] 2019 Device Research Conference (DRC) - Modeling of Leakage-Assist-Switching in Ferroelectric/Dielectric Stack

Si, Mengwei, Lyu, Xiao, Ye, Peide D.
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Year:
2019
DOI:
10.1109/drc46940.2019.9046421
File:
PDF, 388 KB
2019
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