[IEEE 2019 Device Research Conference (DRC) - Ann Arbor, MI, USA (2019.6.23-2019.6.26)] 2019 Device Research Conference (DRC) - Modeling of Leakage-Assist-Switching in Ferroelectric/Dielectric Stack
Si, Mengwei, Lyu, Xiao, Ye, Peide D.Year:
2019
DOI:
10.1109/drc46940.2019.9046421
File:
PDF, 388 KB
2019