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Comparison of Temperature Dependent Carrier Transport in FinFET and Gate-All-Around Nanowire FET
Kim, Soohyun, Kim, Jungchun, Jang, Doyoung, Ritzenthaler, Romain, Parvais, Bertrand, Mitard, Jerome, Mertens, Hans, Chiarella, Thomas, Horiguchi, Naoto, Lee, Jae WooVolume:
10
Journal:
Applied Sciences
DOI:
10.3390/app10082979
Date:
April, 2020
File:
PDF, 2.46 MB
2020