A MIP model and a Biased Random-key Genetic Algorithm based...

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A MIP model and a Biased Random-key Genetic Algorithm based approach for a two-dimensional cutting problem with defects

Gonçalves, José Fernando, Wäscher, Gerhard
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Journal:
European Journal of Operational Research
DOI:
10.1016/j.ejor.2020.04.028
Date:
April, 2020
File:
PDF, 1.20 MB
2020
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