A MIP model and a Biased Random-key Genetic Algorithm based approach for a two-dimensional cutting problem with defects
Gonçalves, José Fernando, Wäscher, GerhardJournal:
European Journal of Operational Research
DOI:
10.1016/j.ejor.2020.04.028
Date:
April, 2020
File:
PDF, 1.20 MB
2020