Conduction mechanisms and charge trapping control in SiO2...

Electrochimica Acta 2020 / 06 Vol. 346

Conduction mechanisms and charge trapping control in SiO2 nanoparticle MIM capacitors

Bheesayagari, Chenna R., Pons-Nin, Joan, Orpella, Albert, Véliz, Bremnen, Bermejo, Sandra, Domínguez-Pumar, Manuel
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Volume:
346
Journal:
Electrochimica Acta
DOI:
10.1016/j.electacta.2020.136202
Date:
June, 2020
File:
PDF, 2.07 MB
2020
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