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[IEEE 2019 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2019.10.13-2019.10.17)] 2019 IEEE International Integrated Reliability Workshop (IIRW) - Impact of Fin Height on Bias Temperature Instability of Memory Periphery FinFETs
Boubaaya, M., Benaceur-Doumaz, D., Ferhat Hamida, A., Djezzar, B., Spessot, A., Linten, D., Horiguchi, N., O'Sullivan, B. J., Franco, J., Litta, E. D., Ritzenthaler, R., Dupuy, E., Machkaoutsan, V., FYear:
2019
DOI:
10.1109/IIRW47491.2019.8989914
File:
PDF, 909 KB
2019