Defect Assisted Carrier Multiplication in Amorphous Silicon

IEEE Journal of Quantum Electronics 2020 / 6 Vol. 56; Iss. 3

Defect Assisted Carrier Multiplication in Amorphous Silicon

Miah, Mohammad Abu Raihan, Niaz, Iftikhar Ahmad, Lo, Yu-Hwa
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Volume:
56
Journal:
IEEE Journal of Quantum Electronics
DOI:
10.1109/JQE.2020.2988263
Date:
June, 2020
File:
PDF, 1.29 MB
2020
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