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Gate-Induced Drain Leakage in Negative Capacitance FinFETs
Gaidhane, Amol D., Pahwa, Girish, Verma, Amit, Chauhan, Yogesh SinghVolume:
67
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.2967463
Date:
March, 2020
File:
PDF, 1.64 MB
2020