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Effect of Stress on Pull-in Voltage of RF MEMS SPDT Switch
Bansal, Deepak, Bajpai, Anuroop, Kumar, Prem, Kaur, Maninder, Kumar, AmitVolume:
67
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.2982667
Date:
May, 2020
File:
PDF, 1.73 MB
2020