Automated defect identification via path analysis-based...

Journal of Systems and Software 2020 / 08 Vol. 166

Automated defect identification via path analysis-based features with transfer learning

Zhang, Yuwei, Jin, Dahai, Xing, Ying, Gong, Yunzhan
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Volume:
166
Journal:
Journal of Systems and Software
DOI:
10.1016/j.jss.2020.110585
Date:
August, 2020
File:
PDF, 2.75 MB
2020
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