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[IEEE 2019 IEEE Conference on Information and Communication Technology (CICT) - Allahabad, India (2019.12.6-2019.12.8)] 2019 IEEE Conference on Information and Communication Technology - Impact of Channel Doping Fluctuation and Metal Gate Work Function Variation in FD-SOI MOSFET for 5nm BOX Thickness
Dubey, Avaneesh K., Pal, Pratosh K., Varshney, Vikrant, Kumar, Ankur, Nagaria, R. K.Year:
2019
DOI:
10.1109/CICT48419.2019.9066255
File:
PDF, 567 KB
2019