BIST-Based Fault Diagnosis for PCM With Enhanced Test...

  • Main
  • 2020
  • BIST-Based Fault Diagnosis for PCM With Enhanced Test...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2020

BIST-Based Fault Diagnosis for PCM With Enhanced Test Scheme and Fault-Free Region Finding Algorithm

Xie, Chenchen, Li, Xi, Lei, Yu, Chen, Houpeng, Wang, Qian, Guo, Jiashu, Miao, Jie, Lv, Yi, Song, Zhitang
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2020
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2020.2986469
File:
PDF, 6.33 MB
2020
Conversion to is in progress
Conversion to is failed