![](/img/cover-not-exists.png)
BIST-Based Fault Diagnosis for PCM With Enhanced Test Scheme and Fault-Free Region Finding Algorithm
Xie, Chenchen, Li, Xi, Lei, Yu, Chen, Houpeng, Wang, Qian, Guo, Jiashu, Miao, Jie, Lv, Yi, Song, ZhitangYear:
2020
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2020.2986469
File:
PDF, 6.33 MB
2020