One scan based high average-utility pattern mining in...

Future Generation Computer Systems 2020 / 10 Vol. 111

One scan based high average-utility pattern mining in static and dynamic databases

Kim, Jongseong, Yun, Unil, Yoon, Eunchul, Lin, Jerry Chun-Wei, Fournier-Viger, Philippe
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Volume:
111
Journal:
Future Generation Computer Systems
DOI:
10.1016/j.future.2020.04.027
Date:
October, 2020
File:
PDF, 1.61 MB
2020
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