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Ranked Feature-Based Laser Material Processing Monitoring and Defect Diagnosis Using k-NN and SVM
Lee, Seung Hwan, Mazumder, Jyoti, Park, Jaewoong, Kim, SeokgooVolume:
55
Journal:
Journal of Manufacturing Processes
DOI:
10.1016/j.jmapro.2020.04.015
Date:
July, 2020
File:
PDF, 2.21 MB
2020