Rapid Identification of X-ray Diffraction Patterns Based on...

Journal of Chemical Information and Modeling 2020 / 04 Vol. 60; Iss. 4

Rapid Identification of X-ray Diffraction Patterns Based on Very Limited Data by Interpretable Convolutional Neural Networks

Wang, Hong, Xie, Yunchao, Li, Dawei, Deng, Heng, Zhao, Yunxin, Xin, Ming, Lin, Jian
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Volume:
60
Journal:
Journal of Chemical Information and Modeling
DOI:
10.1021/acs.jcim.0c00020
Date:
April, 2020
File:
PDF, 2.01 MB
2020
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