Basic metrology for 2020

IEEE Instrumentation & Measurement Magazine 2020 / 5 Vol. 23; Iss. 3

Basic metrology for 2020

Davis, Richard, Schlamminger, Stephan
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Volume:
23
Journal:
IEEE Instrumentation & Measurement Magazine
DOI:
10.1109/MIM.2020.9082793
Date:
May, 2020
File:
PDF, 1.38 MB
2020
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